An introduction to transmission electron microscopy (TEM) and scanning electron microscopy (SEM) for characterization of microstructures in materials science. Techniques and theory for imaging, diffraction and spectroscopy in electron microscopes and applications in materials science will be presented.
At the end of the module, the student is expected to be able to:
know the working principle of both TEM and SEM
know about lens optics included aberrations and astigmatism
know about the signals from interactions between incoming electron and the materials
understand how the different signals can be used in order to get information from the materials
know basic principle for interpretation of experimental data from SEM and TEM
be able to evaluate the value of use SEM and/or TEM in a project
Required prerequisite knowledge
Form of assessment
Participation in laboratory work
3 Laboratory reports that must be approved in order to take the final exam. The laboratory reports are evaluated as passed/failed. The Language for the Laboratory reports and the final oral examination can be either Norwegian or English, according to the students' choice.