The course gives an introduction to transmission electron microscopy (TEM) and scanning electron microscopy (SEM) for characterization of microstructures in materials science.
Content
An introduction to transmission electron microscopy (TEM) and scanning electron microscopy (SEM) for characterization of microstructures in materials science. Techniques and theory for imaging, diffraction and spectroscopy in electron microscopes and applications in materials science will be presented.
Learning outcome
At the end of the module, the student is expected to be able to:
know the working principle of both TEM and SEM
know about lens optics included aberrations and astigmatism
know about the signals from interactions between incoming electron and the materials
understand how the different signals can be used in order to get information from the materials
know basic principle for interpretation of experimental data from SEM and TEM
be able to evaluate the value of use SEM and/or TEM in a project
Forkunnskapskrav
HSE-course for master students (TN501)
Eksamen / vurdering
Oral examination
Vekt 1/1
Varighet 30 Minutes
Karakter Letter grades
Hjelpemiddel None permitted
Oral exam is individual.
To take the oral exam: Approved participation in the laboratory and approved lab repots are required.
Vilkår for å gå opp til eksamen/vurdering
Participation in laboratory work
Participitation 3 laboratory excercises with associated Laboratory reports must be approved in order to take the final exam. The laboratory reports are evaluated as approved/not approved. The Language for the Laboratory reports and the final oral examination can be either Norwegian or English, according to the students' choice.
Method of work
2 hours lectures and laboratory work as arranged. Compulsory laboratory exercises.
Overlapping
Emne
Reduksjon (SP)
Electron Microscopy (MOA130_1)
,
Electron Microscopy (MSK510_1)
Exchange programme at The Faculty of Science and Technology
Admission requirements
Must meet the admission requirements of one of the study programmes the course is open for.
Emneevaluering
The faculty decides whether early dialogue will be held in all courses or in selected groups of courses. The aim is to collect student feedback for improvements during the semester. In addition, a digital course evaluation must be conducted at least every three years to gather students’ experiences.
Litteratur
Issue SEM Compendium Article Schematic illustration SEM Issue Image construction Issue SEM diffraction Issue EBSD Issue TEM Compendium by Jan Ketil Solberg Vidar Hansen Andreas Delimitis, Article Electron backscatter diffraction Pattern formation and collection Setup geometry and pattern formation Syllabus: Electron backscatter diffraction (EBSD); Pattern formation and collection; Setup geometry and pattern formation; EBSD detectors; Sample preparation; Depth resolution; Orientation and phase mapping, Pattern indexing, Pattern centre; EBSD mapping. The rest of the article is not part of the syllabus. View online Issue Fundamentals of Crystallography
The course description is retrieved from FS (Felles studentsystem). Version 1